← Characterization systems
FT-IR & Polarized Microspectroscopy System
Maker: JASCO
Model: FT/IR-6300 + VIRT-3000
Infrared spectrometer that obtains spectral data from computing interference waves. Purpose: IR/THz measurements
← Characterization systems
Maker: JASCO
Model: FT/IR-6300 + VIRT-3000
Infrared spectrometer that obtains spectral data from computing interference waves. Purpose: IR/THz measurements
2-1 Hirosawa, Wako, Saitama 351-0198, JAPAN
Email contact [at]mets.riken.jp